Radio & Wireless 2007 - January 9, 2007 - Rohde & Schwarz has expanded its flagship ZVA Series vector network analyzers with R&S Option ZVA-K7, which enables pulse profile measurements to be made on semiconductor components and antenna/radar systems. Absolute levels, complex S parameters, and other data can be displayed in real time with resolution of 12.5 ns. The option also allows the analysis of periodic and single pulses. The pulsed RF signal is generated by an external signal source such as the R&S SMR signal generator or it can be generated by modulating the signal generator in the R&S ZVA with an external pulse modulator. The concept employed by Rohde & Schwarz is based on directly recording the signal with a sampling rate of 80 MHz, which makes dynamic range and system error correction independent of duty cycle. Pre-trigger and post-trigger settings let the user position the measurement window relative to the pulse signal and selectively measure pulse intervals such as the increase of signal edges. The delays between measurement and reference signal can be easily compensated, and precise ratio measurements can still be performed even if the delays are larger than the pulse width. Option R&S ZVA-K7 allows pulses with a minimum width of 50 ns and rise times of up to 33 ns to be measured. Measurement bandwidth can be up to 30 MHz, and because of the instrument's large memory, the user can continuously record pulse profiles of up to 3 ms. The R&S ZVA-K7 option is available now from Rohde & Schwarz. Depending on the test setup, the R&S ZVA-B16 hardware option is recommended to ensure direct generator and receiver access.