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Keysight: expert to expert
A collective blog from the experts in measurement and design, discussing the latest tools for circuit-level modeling through system verification for General RF/uW, 4G Communications, and Aerospace/Defense applications. Learn about these applications and the EDA simulation software, test and measurement equipment and techniques behind state-of-the-art RF, microwave and high speed design.
Getting ready for one-on-one time at MTT-S IMS 2012
Barry is a Market Segment Manager responsible for deployment of Agilent’s broad range of RF, microwave, and digital products in the Americas. He has held this position since June of 2007.
Barry started his career in HP’s Manufacturing Test Division in 1984. He has worked as a designer in R&D, R&D Project Manager, and R&D Section Manager. Barry has also done business development, sales support and training and been a manager for product marketing, learning products and support. He has worked in manufacturing and spent time overseas working to deploy specialized equipment into manufacturing. His industry experience spans wireless communications, automotive, aerospace defense and general manufacturing test equipment.
Barry holds a Bachelor of Science degree from Montana State University and a Master of Science from Colorado State University.
June is here and the International Microwave Symposium is right around the corner. It seems that we just finished last year’s blockbuster event in Baltimore—but now it’s time to head north and visit the Palais des congrés de Montréal.
The multicolored façade of the Palais symbolizes the plurality of cultures that gives Montreal its charm and energy. Inside the convention center, we’re aiming to foster an equally appealing atmosphere by once again serving as the show’s platinum sponsor and as event sponsor for the MicroApps.
This event is important to Agilent because it enables direct collaboration between us, our customers, and the largest collection of global experts and solution providers in design, integration and manufacturing. All share a common goal: maximizing the performance and efficiency we can extract from the next generation of microwaveand millimeter-wavedevices.
In what has become a tradition, our section of the exhibits will be labeled Agilent Avenue and we’ll be surrounded by 14 of our solution partners. Collectively, we’re ready to discuss your toughest challenges and explore solutions that can help you anticipate future trends, accelerate product development, and achieve a stronger competitive edge.
Bringing our best
By the numbers, our activities may seem overwhelming: five workshops, seven technical sessions featuring previously unpublished research, 24 MicroApp papers, and 25 demonstration stations. Our demos will include solutions in a variety of key areas.
Design: Whether you’re working on MMIC/RF modules, RFICs, or complete systems, our electronic system-level (ESL) design tools are ready for your toughest challenges. We’ll be showing the latest releases of ADS, EMPro, GoldenGate, SystemVue, Genesysand IC-CAP.
Device characterization: For components, frequency converters, and more, accurate measurements and models can help shorten your design cycles. Learn how our nonlinear vector network analyzerand X-parameters* can deliver fast, accurate behavioral models from measurements or from our ADS software. See how you can simplify the setups for conversion-gain and group-delay measurements with the PNA-Xnetwork analyzers.
Signal characterization: As the number of deployed devices grows, interference mitigation becomes increasingly important. Our latest innovations provide the vector signal analysis, 160-MHz bandwidth and MIMOcapabilities needed for 802.11ac devices. Streaming solutionsprovide long-duration gap-free captures for detailed analysis of interference problems.
Signal simulation: The testing of LTE, LTE-Advanced, GNSS and 802.11ac devices requires an array of real-time and standard-compliant signals. At baseband, microwave and millimeter-wavefrequencies, our latest analog and vector signal generatorscan help you see the true performance of your best devices.
System creation: At high frequencies, every element of a test system has to provide excellent performance. Our broad portfolio ofswitching solutionsreaches up to 67 GHz and spans a range of technologies: EM, solid state, PXI and USB.
On-the-go measurements: As deployed technologies become more complex, field personnel need high quality measurement tools designed for tough conditions. Discover what’s possible with our growing range of handheld instruments that includes oscilloscopes, spectrum analyzersand FieldFoxRF analyzers.
Connecting onsite or online
We hope to see you at the Palais in Montréal. If you can’t make it, no problem: You can visit www.agilent.com/find/imsbefore or after the symposium to learn all about it. After the show closes, we’ll be making our technical content available so you can review it at your leisure.
* "X-parameters" is a trademark of Agilent Technologies, Inc. The X-parameter format and underlying equations are open and documented.