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The Microwave Vision Group (MVG) and Amplifier Research (AR) have teamed up to present their combined EMC TurnKey Solutions at EMV in Düsseldorf, Germany from 23 to 25 February.
Keysight Technologies Inc. announced that the Keysight UXM Wireless Test Set is now fully integrated and supported by WaveStudio, MVG’s OTA dedicated measurement software suite. As an integral part of MVG’s OTA measurement solution, the UXM has been used to provide support for carrier aggregation; an important LTE-A feature that requires advanced test and measurement.
The Microwave Vision Group has developed and validated the CXR feed ─a new plug-and-play component that performs cross-polar reduction, similarly to the second reflector in dual compensated Compact Antenna Test Ranges.
Supporting the Microwave Vision Group’s (MVG) vision to bring all products together under one strong brand, Satimo Industries will begin to operate under the new name, MVG Industries, with effective immediately.
The Microwave Vision Group (MVG) has successfully installed its StarLab at Antenna Co.’s design centre in Eindhoven, Netherlands, which will provide the company with an in-house testing resource for the rapid measurement of antennas.
Microwave Vision Group and Amplifier Research have signed a memorandum of agreement that will provide customers with a greater choice of quality EMC and Antenna Measurement turnkey solutions based on their combined expertise and product portfolio.
The 2nd Electronic Design Innovation Conference (EDI CON) is already in sight! Microwave Vision Group (MVG) is pleased to announce its participation in this event which will be held in the Beijing International Convention Center, April 8 -10, 2014.
Keysight Technologies Inc. announced that the Keysight UXM Wireless Test Set is now fully integrated and supported by WaveStudio, MVG’s OTA dedicated measurement software suite. As an integral part of MVG’s OTA measurement solution, the UXM has been used to provide support for carrier aggregation; an important LTE-A feature that requires advanced test and measurement.