advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement

Articles Tagged with ''agilent''

Agilent Technologies to demonstrate new PXI functional test system at NEPCON China 2014

April 23, 2014

Agilent Technologies Inc. announced it will demonstrate its latest PXI Functional Test System, plus boundary scan and latest inline in-circuit test systems, at NEPCON EMT China 2014 (Booth 1G60), April 23-25, at the Shanghai World Expo Exhibition & Convention Center.


Read More

Agilent offers first user-extensible recorder application for real-time spectrum analyzers

April 16, 2014

Agilent Technologies Inc. announced the availability of the option RTR, the industry’s first real-time spectrum recorder and analyzer application example for real-time spectrum analyzers (RTSAs).


Read More

Agilent Technologies announces single-slot eight-channel 8-bit PCIe Gen2 digitizer

April 15, 2014

Agilent Technologies Inc. introduces an eight-channel version of its U5309A 8-bit single-slot PCIe®Gen2 digitizer with on-board processing, providing unprecedented channel density and minimum footprint at this level of performance.


Read More

Agilent and FIME announce availability of mobile payment test systems based on EMV contactless level 1 specifications

April 9, 2014

Agilent Technologies Inc. and FIME, a secure-chip consulting and testing provider, announced the availability of test systems based on the EMV® Contactless Level 1 Specification for mobile payments.


Read More

Agilent announces NFC Forum approval for analog test system

April 1, 2014

Agilent Technologies Inc. announced the successful validation of its T3111S NFC Test System for NFC Forum Analog testing.


Read More

Agilent introduces industry’s first LTE-Advanced uplink 4x4 MIMO signal generation solution

March 24, 2014

Agilent Technologies Inc. introduced the industry’s first LTE-A uplink 4x4 MIMO signal generation solution designed to enable R&D engineers to verify FDD and TDD LTE-A Evolved Node B receivers. The solution comprises N7624B/25B Signal Studio for LTE/LTE-Advanced FDD/TDD software with newly added support for UL 4x4 MIMO.


Read More

Agilent, U.C. Berkeley partner to accelerate student learning in engineering

March 20, 2014

Agilent Technologies Inc. announced it will work with the College of Engineering at the University of California, Berkeley, to provide an enhanced learning experience for engineering students using Agilent’s BenchVue software.


Read More

Agilent announces passive network probing solution for LTE networks

March 18, 2014

Agilent Technologies Inc. announced a significant enhancement to its Passive Network Monitoring System for converged telecommunication networks across 2G, 2.5G, 3G and now 4G LTE technologies.


Read More

Agilent announces next-generation system for measuring flicker noise

March 14, 2014

Agilent Technologies Inc. introduced the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).


Read More

Agilent to show test and measurement solutions at OFC 2014

March 12, 2014

Agilent Technologies Inc. will show test and measurement solutions at the Optical Fiber Communication Conference & Exposition, March 11-13 in San Francisco, CA. Agilent is the only T&M vendor offering solutions along the entire value chain of the Web 2.0—from components through data centers to telecom, addressing the latest technologies such as silicon photonics and coherent, multi-carrier transmission.


Read More

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement