Articles Tagged with ''labview''

Re-defining device characterization test as Mesuro launches ‘rapid load pull solution’

Mesuro launches a new test solution that provides the industry substantial benefits in approaches to device characterization test. The new offering utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide extremely rapid test scenarios to be run on the device under test.


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AWR announces slate of activities during EuMW 2012

AWR Corp., the innovation leader in high-frequency EDA software, announced its slate of product and technology activities scheduled during the European Microwave Week (EuMW) in Amsterdam.  EuMW is Europe’s premier microwave, RF, wireless and radar event and runs from October 28 through November 2, 2012.  Highlights of activities include:


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National Instruments introduces world’s first RF vector signal transceiver

National Instruments introduced the world’s first RF vector signal transceiver (VST), the NI PXIe-5644R, and with it, a new class of software-designed instrumentation. This software-centric architecture represents a new era in which engineers and scientists can use LabVIEW to tailor open, field-programmable gate array (FPGA)-based hardware for their specific needs.


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