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ARTICLES

Rohde & Schwarz and Mesuro to showcase joint non-linear testing solutions at EuMW

 Rohde & Schwarz and Mesuro showcase their continuing collaboration on non-linear measurement solutions at European Microwave Week in Rome. In a joint demo at the Rohde & Schwarz booth (hall 9, booth 102), the companies present their testing solution based on the R&S ZVA vector network analyzer from Rohde & Schwarz and Mesuro’s behavioral modeling formulations. 


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Re-defining device characterization test as Mesuro launches ‘rapid load pull solution’

Mesuro launches a new test solution that provides the industry substantial benefits in approaches to device characterization test. The new offering utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide extremely rapid test scenarios to be run on the device under test.


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Mesuro Exhibiting New Capabilities at EuMW 2011

Mesuro , booth 535, is exhibiting the following new capabilities for the first time at European Microwave Week in Manchester: VNA Based Active Load Pull Solutions Mesuro will be demonstrating both fundamental load pull, to 67 GHz, and active harmonic load pull using the Rohde &Schwarz ZVA67 VNA as...
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