Items Tagged with 'bert'

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Technical and educational sessions addressing high-speed signal integrity challenges to be conducted by Anritsu at DesignCon 2014

Anritsu Co. (DesignCon booth #501), a world leader in high-speed signal integrity test solutions, will present a series of technical and educational sessions during DesignCon to help engineers solve the measurement challenges associated with designing high-speed semiconductors, and communications systems and devices. Additionally, technical demonstrations will be held in the Anritsu booth throughout DesignCon, which is scheduled for January 28-31 in the Santa Clara Convention Center, Santa Clara, CA.


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Agilent introduces series of BER test solutions for faster design verification

Test & Measurement

M8000seriesAgilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.


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Anritsu extends 4Tap emphasis to 32 Gbit/s for high-speed interconnect design evaluation

Test & Measurement

Anritsu Co. introduces a 32 Gbit/s extension option for its MP1825B 4Tap Emphasis that features industry leading Tr/Tf speeds and low jitter for up to four taps, allowing it to create emphasis that matches every industry standard. The MP1825B with the new option can be configured with the Anritsu MP1800A BERT signal quality analyzer to accurately measure the performance of high-speed interconnects used in Next Generation Network (NGN) applications in a cost- and time-efficient manner.


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