Items Tagged with 'FormFactor'

Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. 

The University of Texas at Austin, Rohde & Schwarz and FormFactor have collaborated to characterize a new technology for RF switches that improves battery life performance and supports higher bandwidths and switching speeds.