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A Method of Measuring Large-signal S-parameters of High Power Transistors

Determination of large-signal scattering parameters of high power transistors from measured data during normal operation
TECHNICAL FEATURE A Method of Measuring Large-signal S-parameters of High Power Transistors A measurement method for scattering parameters (S-parameters) of high power transistors is presented. The proposed method directly determines the S-parameters of high power transistors by measuring overall gain, phase and S-parameters of input and output matching network...
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