NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, released the Wireless Test System (WTS), a solution that dramatically lowers the cost of high-volume wireless manufacturing test. Although faced with the rising complexity of wireless test, companies can confidently reduce test costs and multiply throughput on the production floor with a system optimized for measurement speed and parallel test.
NI (formerly AWR Corp.) released its version 12 Analyst-MP™ 3D multiphysics finite element method (FEM) electromagnetic (EM) analysis software. This latest version delivers up to 10X improvement in speed from the previous version, making it even faster for analyzing extremely complex high-frequency, multiphysics structures.
NI announces the availability of the first major release in 2015 of NI AWR Design Environment™ for designers of monolithic microwave integrated circuits, radio-frequency printed circuit boards, modules and more. This release boasts load-pull and antenna- and radar-specific features, as well as ease-of-use improvements, speed enhancements and third-party integration flows for improved stability analysis and design rule checking/layout versus schematic.