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Runcom Technologies Ltd. , a supplier and developer of fixed and mobile WiMAX™ solutions, and Rohde & Schwarz , the leader in wireless communications test and measurement, have completed a scalable turnkey solution for a mass production line for mobile stations based on Runcom OFDMA technology. The R&SCMW270 WiMAX...

Keithley Instruments Inc. , a leader in emerging measurement solutions, announced ACS Basic Edition, characterization and curve tracer software for component test applications. The latest addition to Keithley's powerful Automated Characterization Suite (ACS) family, ACS Basic Edition integrates with the industry's broadest range of source-measure units, Keithley's SourceMeter® Instrument...

Under the banner of 75 Years of Driving Innovation , Rohde & Schwarz invited more than 200 guests from around the world to celebrate its landmark 75 th anniversary at its state-of-the-art Technology Center in Munich, Germany, which opened in 2005. The Prime Minister of the State of Bavaria,...

The recent Roke Manor sponsored November ARMMS Conference in Corby UK, attempted and succeeded in breaking new ground at a juncture that the ARMMS chairman, Roger Hopper, described as, “interesting times”. To stimulate debate and attract a wider and more inclusive audience the program coordinator, Dominic FitzPatrick of Cardiff...

SUSS MicroTec Test Systems has won a head-to-head evaluation with its PA300PS with ProbeShield® Technology, the 300 mm wafer-level probe system for device characterization and reliability test. As a result, the major US integrated device manufacturer (IDM) has named SUSS as its exclusive supplier of on-wafer characterization systems for...