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Technical Feature Measurement of On-wafer Transistor Noise Parameters Without a Tuner Using Unrestricted Noise Sources This article presents a method for calibrating the four noise parameters of a noise receiver which does not require a tuner. The method permits using general (mismatched) noise sources, which may present very different...

Technical Feature Two-tone vs. Single-tone Measurement of Second-order Nonlinearity Darioush Agahi, William Domino and Nooshin Vakilian Conexant Systems Inc. Newport Beach, CA This article describes how to correctly find the second-order intercept point (IP2) from one- and two-tone tests, and presents measurement results in support of the theory. Relation...

Technical Feature Fixing the Curtice FET Model Convergence difficulties are common in nonlinear analyses of circuits using a Curtice model. The problem is not the model itself, but the limitations of the parameters describing the gate I/V characteristic. In this article, we show why that failure occurs, and how...

Technical Feature Simulating Multi-finger Power HBTs A new model of multi-finger heterojunction bipolar transistors (HBT) is presented to analyze and predict current collapse, bias dependence and output power. The simulation of multi-finger HBTs has proven to be very challenging in both computer-aided design and electromagnetic (EM) simulation. However, by...

New Products COMPONENTS SP4T Switch The model AS204-80 GaAs IC SP4T switch combines high isolation to provide greater sig- nal path separation and reduced RF leakage with non-reflecting ports to eliminate the need for external terminations while providing 50 W output impedance. Covering the frequency range of DC to...

Around the Circuit INDUSTRY NEWS Advanced Power Technology Inc. (APT) has entered into a definitive agreement to acquire GHz Technology Inc. Under the terms of the agreement, APT will issue approximately 1.48 million shares of common stock and $13.3 M in exchange for the business and assets of GHz...

New Literature General Purpose Test Instruments Catalog This 64-page, full color catalog contains detailed information on more than 330 of the company's newest test and measurement products, accessories and support services that can help R&D and manufacturing test engineers. The catalog is designed to help engineers find product information...

Workshops & Courses International Workshop on Wafer Level CSP and Flip Chip Packaging Topics : Wafer level packaging materials and processes, wafer level burn-in and test, small die and memory products, ultra-high density substrate technologies for WLP, new and advanced wafer technologies, wafer package reliability. Site : Stone Mountain,...

News From Washington Engineered Support Receives $3.5 M Order for Avionics Testing System from US Navy Engineered Support Systems Inc. received a $3.5 M order from the US Navy for the production of aircraft avionics testing subsystems for Consolidated Automated Support Systems (CASS). This order, which represents a modification...

International Report Thales Wins Euro 210 Million NH90 Contract International avionics contractor Thales Avionics has been awarded a Euro 210 million contract covering the supply of avionics and electrical power system equipment into the multi- national NH 90 helicopter programme. Working with partners Diehl Avionik Systeme, Teldix, Galileo Avionica...