Negative-Refraction Metamaterials: Fundamental Principles and Applications
Wiley-IEEE Press
433 pages; $74.95
ISBN: 0-471-60146-2
Metamaterials represent an exciting emerging research area that promises to bring about important technological and scientific advancements in diverse areas such as telecommunications, radar and defense, nanolithography with light, microelectronics, medical imaging, etc. This book includes contributions from some of the top experts in the field in an effort to document in an authoritative and understandable way the most important and most recent developments. In this book, both artificial dielectric and photonic crystal types of materials are covered. However, its scope is restricted to metamaterials that support the “unusual” electromagnetic property of negative refraction. Chapter 1 describes the fundamentals of isotropic metamaterials in which a simultaneous negative permittivity and permeability, hence a negative refracting index, can be defined. Chapter 2 builds upon these fundamentals in order to describe a range of useful microwave devices and antennas. Chapter 3 develops in a comprehensive manner the theory and experiments behind a super-resolving, negative-index, planar transmission-line lens. Chapter 4 describes numerical simulation studies of negative refraction of Gaussian beams and associated focusing phenomena. Chapter 5 exposes the theory and the unique advantages of shaped lenses made out of negative-refractive-index metamaterials. Chapter 6 introduces a new kind of transmission line metamaterial that is anisotropic and supports the formation of sharp beams called resonance cones. Chapter 7 explains how to obtain negative refraction and associated super-resolving imaging effects using dielectric photonic crystals. Chapter 8 prescribes a method for realizing negative-refractive-index metamaterials using plasmonic (metallic) nanowires. Chapter 9 deals with the unusual propagation phenomena in metallic waveguides partially filled with metamaterials. Finally, Chapter 10 introduces metamaterials in which the refractive index and the underlying group velocity are both negative.
To order this book, contact: John Wiley & Sons Inc., 111 River Street, Hoboken, NJ 07030 (201) 748-6000.
Measurement Systems and Sensors
Artech House
336 pages; $95, £58
ISBN: 1-58053-945-9
Modern measurement systems make extensive use of computers and sensors to increase the speed and the accuracy of the desired data acquisition. This book offers a comprehensive coverage of the status of the present measurement technology. Chapter 1 starts with a description of computer-based measurement systems. Chapter 2 describes sensors and electrical circuits for temperature measurements, such as resistive sensors, thermocouples and semiconductor devices. Stress and pressure sensors are the subjects of Chapter 3. Resistance and capacitance strain gauges convert a change in dimension into an electrical signal. Piezoelectric sensors convert a force into an electric voltage. The measurement signal at the output of the sensors is an analog quantity, which must be converted into digital signals in order to be processed in computer systems. This conversion is described in Chapter 5. Chapter 6 is devoted to wired measurement systems with a serial interface, where the bits are transmitted one by one, timed by a synchronizing clock. Chapter 7 describes wireless transmission systems that are the only ones possible when the measured object is moving, is a long distance away from the measurement center or is hardly accessible. Parallel transfer of digital data offers a much higher data rate than serial transfer, but uses wired channels only. The dominant parallel interface standard is the IEEE-488 (IEC-625) standard that is described in Chapter 8. Chapter 9 considers crate and modular measurement systems, where instruments are arranged in crates, also referred to as chassis or main frames containing functional modules. Chapter 10 covers LAN-based measurement systems. These computer network-based solutions represent an important trend in the evolution of measurement systems. Chapter 11 is dedicated to DAQ boards and virtual instruments, supporting multi-channel measurements, performing different functions, and sending analog and digital activation or test signals to the measurement system.
To order this book, contact: Artech House, 685 Canton St., Norwood, MA 02062 (781) 769-9750 ext. 4030; or 46 Gillingham St., London SW1V 1HH UK +44 (0) 207-8750.