The HR-R 8-1 magnetic field probe developed by Langer EMV-Technik GmbH is a new measurement and analysis tool for research and development of electronic assemblies and RF structures. It is used in the fields of Industry 4.0, IoT, automotive or robotics. The near-field probe enables RF measurements on traces, individual components or ICs. With its sensitivity in the RF range up to 40 GHz in the near-field, the passive probe enables analyses during development that were not possible before. The HR-R 8-1 magnetic field probe provides information on the emissions of interference and the associated influence of electromagnetic fields on neighboring assemblies – these findings can contribute to a more cost-efficient design in the development process.
To achieve the probe's characteristic values, the development team of Langer EMV-Technik paid particular attention to a combination of head size and short signal paths in the probe head. As a result, this near-field probe offers a particularly high H-field sensitivity.
For spatially reproducible measurements, the probe can be used in an automatic positioning system, for example in a Langer scanner. The probe is therefor used with the SH 01 probe holder in the Langer scanner.
Precision handcrafted in Germany, the H-field probe is supplied in a set consisting of the HR-R 8-1 probe, the operating manual and the USB stick with probe characteristics.