Marvin Test Solutions, Inc. announced that its director of Marketing, Jon Semancik, has been elected to the position of president of the PXI Systems Alliance (PXISA), effective immediately.  

Semancik is a U.S. Navy veteran, with a 35-year background in the test and measurement industry, including extensive experience in ATE system design and integration, data acquisition system design and implementation, product management and TPS software development. He holds a BSEE from Fenn College of Engineering and an MBA from the Weatherhead School of Management at Case Western Reserve University.

“I am honored to be chosen to lead this organization as we continue to evolve the PXI standard and extend its reach into new markets and applications,” said Semancik. “The PXI platform continues to provide a high performance, scalable solution for a wide variety of test and data acquisition applications in the commercial, industrial, aerospace and military arenas.”

Marvin Test Solutions has been a Sponsor member of the PXISA since 1999. Today, the company’s GENASYS mixed-signal test platform and suite of 5G semiconductor test solutions bring the advantages of the flexible, scalable, PXI architecture to leading-edge test applications for mission-critical, high-value products from semiconductor devices to vehicles, aircraft to satellites.

“Jon Semancik’s experience and expertise in the test industry will enable the progress and future development of the PXI standard and the member companies,” said Marvin Test Solutions’ President, Loofie Gutterman, past president of the PXISA from 2003 to 2018. “I look forward to seeing the new heights will be reached by the alliance under Jon’s leadership.”

The PXI Systems Alliance is an industry consortium that defines and manages the PXI system specifications which includes hardware and software requirements—ensuring system interoperability and ease of integration. The Alliance currently includes 67 companies that design and produce PXI-based instrumentation and systems, providing a breadth of options to suit any test requirement.