Workshops & Courses
Advanced Design Seminars
Topics : The company's new spectral-domain system simulator, SPECTRASYS, is presented. Focus will be on practical implementations of systems using SPECTRASYS to detect signal peak paths, conducted emissions, adjacent channel distortion and channel power measurements.
Site : See www.eagleware.com
Dates : April 30-May 30, 2002
Contact : Eagleware Corp., 635 Pinnacle Court, Norcross, GA 30071 (678) 291-0995.
Advanced Technology Workshop on Ceramic Technologies for Microwave and Photonic Packaging
Topics : Critical issues in packaging for microwave and photonic technology, essential in reducing time-to-market, costs and wide-scale deployment of these rapidly growing technologies.
Site : Providence, RI
Dates : May 2-3, 2002
Contact : IMAPS, 611 2nd Street, NE, Washington, DC 20002 (202) 548-4001, fax (202) 548-6115.
RF Wireless System Design Fundamentals
Topics : Combines theory with real-life examples to provide participants with a complete foundation in digital communication techniques and their effect on RF circuit parameters, to help them close the gap between traditional RF engineering design and the needs of modern communication systems.
Site : San Francisco, CA
Dates : May 6-8, 2002
Contact : Besser Associates, 201 San Antonio Circle, Building E, Suite 280, Mountain View, CA 94040 (650) 949-3300, fax (650) 949-4400.
Antennas: Principles, Design and Measurements
Topics : Antenna fundamentals, arrays, wire antennas, broadband antennas, horns, reflectors, antennas in systems, antennas for wireless communications and measurements.
Site : Orlando, FL
Dates : May 20-23, 2002
Contact : Leanne Traver, NCEE, 68 Port Royal Square, Port Royal, VA 22535-0068 (804) 743-5611, fax (804) 742-5030.
Microwave Antenna Measurements: Far-Field, Near-Field, Compact Ranges and Anechoic Chambers
Topics : Design, use and evaluation of anechoic chambers, far-field, near-field and compact ranges, techniques for the determination of antenna radiation patterns, directivity, gain, polarization and impedance, phase array testing and alignment, radar cross-section measurements and radar imaging techniques.
Site : Northridge, CA
Dates : June 11-14, 2002
Contact : Shirley Lang (818) 677-2146, fax (818) 677-5982 or e-mail: email@example.com.
Network Analysis Measurements
Topics : Network analysis principles, S-parameters, architecture of vector network analyzer, operation, calibration techniques, time domain techniques. This course includes technical lab sessions.
Site : Winnersh, UK
Dates : June 18-19, 2002
Contact : Tracey Bull +44 118 9276741, fax +44 118 9276862 or e-mail: firstname.lastname@example.org.
Advanced Technology Workshop on Passive Integration
Topics : Design, simulation and libraries, material systems, fabrication of passive elements in component platforms, capacitors, connectors, diodes, flex circuits, ferrites, inductors, resistors, thermistors and varistors.
Site : Oqunquit, ME
Dates : June 19-21, 2002
Contact : Robert Hestand, AVX Corp. (843) 444-2886.
RF & Microwave Fundamentals
Topics : Understand the principles of RF/microwave engineering, undertake RF measurements using power meters, spectrum analyzers and network analyzers. Introduction to noise figure and phase noise is also included.
Site : Winnersh, UK
Dates : July 2-5, 2002
Contact : Tracey Bull +44 118 9276741, fax +44 118 9276862.