ARC Technologies will be presenting solutions for RF & Electromagnetic Interference at the upcoming RFID Journal Live! event taking place May 3-5 at the Orange County Convention Center in Orlando, Fla.
The annual RFID Journal Live! (www.rfidjournalevents.com), now in its 14th year, is the world’s largest conference and exhibition devoted to radio-frequency identification (RFID) and related technologies.
ARC Technologies (Booth #644) will be exhibiting its industry-leading microwave absorbing solutions for commercial, industrial and defense applications, including radar, microwave and EMI control.
Among its many material solutions for noise and interference, ARC Technologies will highlight its AC2ES® and Wave-X product lines at RFID Journal Live! ARC Technologies will also be discussing its wide range of testing capabilities available to service the RFID market.
AC2ES is a transparent, highly conductive thin-film that provides excellent EMI shielding capabilities. Based on proprietary electroplating technology using conductive nanoparticles and optical-grade PET thin films, AC2ES is a low-cost replacement for indium-tin-oxide (ITO) films. These clear, conductive films are available in sheets or rolls as well as formed into three-dimensional (3D) structures to specific customer requirements.
Visitors to ARC Technologies’ booth at RFID Live! 2016 can learn more about these innovative thin-film materials, including how they can be used with glass and other substrates to form low-cost RFID antennas, as well as antennas for automotive applications.
ARC Technologies will also show its Wave-X family of products for controlling EMI at frequencies from 5 MHz-110 GHz. These noise-suppressing products include Wave-X sheets, Wave-X Z EMI/RF absorbing cable coatings, and Wave-X WT materials.