Items Tagged with 'application'

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Agilent has a new application note titled "Understand the Basic Principles of Vector Network Analysis" available now.

Agilent Technologies Inc. announced the latest enhancement on its Command Expert software for faster and easier instrument control in many test application development environments.

AWR’s new application note titled, "Multisim/Ultiboard for Low-Frequency Simulation and Layout" details how to complement Microwave Office® circuit design software with NI’s Multisim circuit simulation software and Ultiboard printed circuit board (PCB) layout software for a comprehensive design flow.

Michael Casper, president and CEO of UltraSource Inc., a thin film microchip manufacturer, is pleased to announce the update of an application note on the company's website titled: “How Your CAD File Affects the Success of Your New Thin Film Design.”

AWR's new application note, “Using Analyst™ To Quickly And Accurately Optimize A Chip-Module-Board Transition,” highlights the unique features of its’s 3D finite element method (FEM) EM simulator by demonstrating the optimization of the transition from a board-to-chip signal path.

AWR has just published a new Microwave Office® software application note titled, “End-to-end Design and Realization of an X-band Transmission Analyzer Using AWR Circuit, System, and EM Software.” The note examines the complete flow and details the design of several critical design elements for this device, which integrates many RF components on a single printed circuit board (PCB).

Agilent Technologies Inc. introduced compliance testing support for Energy-Efficient Ethernet (EEE) standards used in networking applications. Agilent’s solution for transmitter tests includes 10BASE-T, 100BASE-T and 1000BASE-T EEE test standards as described in the IEEE 802.3az-2010 specification.

Agilent’s new application note describes how the 89600 VSA software’s multi-measurement capability facilitates testing wireless devices and systems handling multiple carriers and formats at the same time.

What: This application note addresses test challenges faced by phased array antenna engineers including:

• The need for fast wideband, high resolution sampling of IF signals post downconversion.

EMSCAN in partnership with DVT Solutions is pleased to announce Far-Field Application for EMxpert: “The world’s fastest pre-compliance verification of PCB’s”.