Keysight: expert to expert
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A collective blog from the experts in measurement and design, discussing the latest tools for circuit-level modeling through system verification for general RF/microwave, 4G and 5G communications and aerospace/defense applications. Learn about these applications and the EDA simulation software, test and measurement equipment and techniques behind state-of-the-art RF, microwave and high speed design.

What’s next in wireless? The path from 4G LTE to 5G

Opportunities abound as do challenges. To unleash the 5G business potential, chipset and device engineers must overcome significant challenges in the technology evolution and revolution: millimeter-wave (mmWave) propagation and channel modeling, wideband calibration, antenna complexity, 3D beamforming, over-the-air (OTA) measurements, protocol optimization for peak data throughput, digital interface capacity, battery life; the list goes on.


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Extending the Life of Test Systems that Support Long-term Programs

Jim Curran, Keysight Technologies, Inc. (formerly Agilent Technologies electronic measurement business)

At the beginning of every new product program, tremendous amounts of time, attention and money go into defining and integrating the required test system. The system is used to test the new products, ensuring that they function at the required levels and remain highly productive. The system is also expected to last for the life of the program.


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Reducing the Test Time Required to Calibrate a Multi-channel Antenna

By Dave Brannon and Alex Dickson, Keysight Technologies, Inc. (formerly Agilent Technologies electronic measurement business)

 For active antenna arrays, a significant amount of production test time is spent on calibration.  Large arrays can consist of hundreds or thousands of elements and it is necessary to characterize the phase and gain alignment between these elements to ensure precise beam-forming.  In addition, the test time to align these elements can increase dramatically as the number of elements increases.  Hence, the ability to accelerate test by using multiple coherent measurement channels is a significant benefit. 


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