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ARTICLES

Keithley Wireless Test System Selected as Finalist in EDN Magazine Innovation Award Competition

March 31, 2008
Keithley Instruments, Inc., a leader in solutions for emerging measurement needs, has been named a finalist in EDN Magazine's 18th Annual Innovation Awards Competition in the General Purpose Test and Measurement category for its 4X4 MIMO (multiple-input, multiple-output) RF Test System.
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