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Anritsu Co. introduces the MT8860C WLAN Test Set, a fully integrated test solution that performs high-speed radio layer measurements on WLAN chip sets. The MT8860C combines the capabilities of a power meter, spectrum analyzer, and vector signal generator to provide designers and manufacturers with a single instrument that performs traceable and repeatable measurements on WLAN devices to ensure they are in full compliance with IEEE 802.11-2007 standards.
A unique feature of the MT8860C is its Network mode, which uses standard WLAN protocol messaging to perform transmitter and receiver measurements on a device under test (DUT) without the need for test control software from the device manufacturer. Network mode is especially important when testing the new generation of consumer products, such as smart phones and PDAs, that embed WLAN technology.
The MT8860C also has a Direct mode, in which the test set automatically creates and transmits WLAN packets to measure the DUT receiver, and measures the DUT transmitter via a built-in transmitter analyzer. In Direct mode, the DUT is controlled by the chipset supplier’s test mode software.
To further enhance the MT8860C in volume production environments, Anritsu has developed LANTest software with DUT control packages. The control packages have been designed in partnership with leading WLAN silicon developers to provide a fully automated PC application for rapid testing of WLAN devices without manual intervention.
The MT8860C provides significant advantages over existing multi-instrument test configurations. The integrated test set design of the MT8860C eliminates the need to calibrate the interconnections between numerous test instruments. The internal reference radio does not suffer the drift and variability of external gold radios to create a more stable test system and better output quality.
Measurement test times are also significantly reduced because of the MT8860C’s integrated spectral processor. Tests, such as peak and average power, spectral mask compliance, spectral flatness and EVM, are measured in parallel and displayed in typically 500 ms, an eight-fold improvement over alternative test systems.
“The introduction of the MT8860C is the latest innovation that confirms our commitment to delivering excellent test solutions to our customers in the short range wireless market. By partnering with key silicon developers, we have developed uniquely powerful solutions that greatly simplify the introduction of their products into production,” said Donn Mulder, vice president/general manager of Anritsu’s Microwave Measurement Division (MMD).
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