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"Addressing Metrology Needs for Future High Speed Information and Communications Systems" was the theme of the 69th ARFTG Microwave Measurement Conference held June 8th in Honolulu, HI, as part of the International Microwave Symposium - Microwave Week.
The technical program began with "Characterization Challenges for Future Base Station Power Amplifiers," an invited talk by Wolfgang Heinrich of FBH in Berlin, Germany.
Overall the technical program was particularly strong with 12 oral presentations and 24 interactive forum posters covering a wide range of microwave measurement subjects.
The breaks and the late afternoon interactive forum session provided excellent opportunities to network and discuss details with the many paper presenters, exhibitors and expert technical attendees. ARFTG is a regular meeting place for leaders in measurement of nonlinear devices, regularly hosting nonlinear vector network analyzer users' group meetings and the nonlinear measurement workshop at the Fall conference.
ARFTG is soliciting submissions for the next meeting in Tempe, AZ, November 27th -30th, 2007. The Fall conference theme is "High Power RF Measurement Techniques," but paper submissions are invited in any of the topic areas related to microwave measurement.
An RF PA Design short course featuring Dr. Steve Cripps of Hywave Associates and a Nonlinear Measurement workshop are planned to round out the symposium week. Details are available at www.arftg.org.
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