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Industry News

Impdeance Measurements for High Power RF Transistors Using the TRL Method

Use of the thru-reflect-line (TRL) calibration technique to obtain precise characterization of high power RF transistors, including impedances and board measurements for de-embedding

October 1, 1999
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Technical Feature

Impedance Measurements for High Power RF Transistors Using the TRL Method

Jean-Jacques Bouny

Please click here to view the pdf file of the Technical Feature

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