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Test and Measurement Channel / Industry News

Agilent application note: Increase phased array antenna test throughput with Agilent digitizer

October 26, 2012
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What: This application note addresses test challenges faced by phased array antenna engineers including:

  • The need for fast wideband, high resolution sampling of IF signals post downconversion.
  • The need to achieve phase coherent sampling across all input channels, providing relative magnitude and phase measurements.
  • The need to make different trade-offs between sensitivity and analysis bandwidth per the test scenario.

When: Available now

Where: The application note can be downloaded at: http://cp.literature.agilent.com/litweb/pdf/5991-1351EN.pdf     

Additional Informationwww.agilent.com/find/M9703A

Recent Articles by Agilent Technologies Inc., Santa Clara, CA

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