advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
Industry News

Agilent application note: Increase phased array antenna test throughput with Agilent digitizer

October 26, 2012
/ Print / Reprints /
| Share More
/ Text Size+

What: This application note addresses test challenges faced by phased array antenna engineers including:

  • The need for fast wideband, high resolution sampling of IF signals post downconversion.
  • The need to achieve phase coherent sampling across all input channels, providing relative magnitude and phase measurements.
  • The need to make different trade-offs between sensitivity and analysis bandwidth per the test scenario.

When: Available now

Where: The application note can be downloaded at:     


Recent Articles by Agilent Technologies Inc., Santa Clara, CA

Post a comment to this article


Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.


advertisment Advertisement