- Buyers Guide
Delivers Comprehensive 3G LTE Mobile Device Test Capabilities. Features Include Fully Integrated RF Interface, Baseband and IP Protocol Stack, RF Parametric and Protocol Test, and Intuitive Touch-screen Control.
LTE World Summit, London and Stevenage, England—Nov. 18, 2008—Aeroflex has launched the 7100 Digital Radio Test Set designed to enable chip-set designers, software developers and handset manufacturers to accelerate the pace of development projects to meet the requirements of the new 3GPP Rel-8 E-UTRAN standard better known as 3G LTE. The Aeroflex 7100 delivers the most comprehensive testing capability for 3G LTE mobile devices available in a single bench-top instrument.
Utilizing intuitive touch screen technology to provide easy access to comprehensive test functionality, the Aeroflex 7100 incorporates a fully integrated RF interface, baseband and protocol stack. The Aeroflex 7100 simulates the network from the physical layer to the core network IP infrastructure uniquely offering both parametric analysis and protocol logging and diagnostics. End-to-end IP connectivity allows the data throughput performance and latency to be assessed. With a base frequency range of up to 6GHz, the Aeroflex 7100 is designed to cope with both current and potential future spectrum allocations.
Optional features of the Aeroflex 7100 include 2x2 MIMO and built in ‘fading’ simulation, allowing device throughput to be assessed in real-world conditions. An optional second RF carrier is also available for handover test scenarios, a major challenge for mobile device designers. Future options will include GSM/GPRS/EDGE and WCDMA/HSPA which will enable inter-system handover to be tested, a critical feature for new network roll-out.
The Aeroflex 7100 is based on tried and tested Aeroflex RF and baseband technology and is primarily targeted at the 3G LTE R&D market, providing a test solution for developers designing new chip-sets, protocol stacks and devices supporting the 3G LTE standard. The core application will be functional tests (call set-up and termination) and parametric measurements (transmitter power, receiver sensitivity) that need to be performed to confirm correct operation of new designs on the bench. Typical users will be chip (FPGA/ASIC) designers, protocol stack developers, application software developers, integration test teams, pre-certification test labs, software regression test teams, field trial test engineers, handset acceptance test groups and end-of-line production quality testers, where interactive communication with the completed device is needed.
“The realization and rapid deployment of 3G LTE technology is totally dependent on providing high-quality, cost-effective test solutions to both designers and manufacturers,” said Phil Medd, Product Manager for the Aeroflex 7100. “The Aeroflex 7100 provides unprecedented test support in a single bench-top instrument across a broad spectrum of design and manufacturing disciplines.”