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Test and Measurement

Agilent Offers New Application Note on Testing DigRF Interfaces

December 20, 2011
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What: The new “Solutions for Testing DigRF Interfaces” 5990-9501EN, offers insight into how to quickly and efficiently characterize your digital wireless devices. It is part of a series of Agilent Power of X application notes created to provide insight into solving tough measurement problems in a unique way for both the design and manufacturing environments.

When: Available today

Where: To request copies of the free application notes go to www.agilent.com/find/powerofx Registration is required

Additional Information: www.agilent.com/find/powerofx

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