advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
Test and Measurement

Agilent Offers New Application Note on Testing DigRF Interfaces

December 20, 2011
/ Print / Reprints /
| Share More
/ Text Size+

What: The new “Solutions for Testing DigRF Interfaces” 5990-9501EN, offers insight into how to quickly and efficiently characterize your digital wireless devices. It is part of a series of Agilent Power of X application notes created to provide insight into solving tough measurement problems in a unique way for both the design and manufacturing environments.

When: Available today

Where: To request copies of the free application notes go to www.agilent.com/find/powerofx Registration is required

Additional Information: www.agilent.com/find/powerofx

Post a comment to this article

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement