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Agilent Offers New Application Note on Testing DigRF Interfaces
What: The new “Solutions for Testing DigRF Interfaces” 5990-9501EN, offers insight into how to quickly and efficiently characterize your digital wireless devices. It is part of a series of Agilent Power of X application notes created to provide insight into solving tough measurement problems in a unique way for both the design and manufacturing environments.
When: Available today
Where: To request copies of the free application notes go to www.agilent.com/find/powerofx Registration is required
Additional Information: www.agilent.com/find/powerofx