Test and Measurement Channel

Anritsu LTE Test Leadership Position on Display at CTIA WIRELESS 2009

Participation in 3GPP Standardization and Working Closely with Major Infrastructure, Chipset and Terminal Developers Have Paved Way for Development of LTE Test Solutions.

April 2, 2009 - Anritsu Company's LTE test solutions that can be used by leading Network Equipment Vendors (NEMs), device manufacturers and operators are on display in Anritsu's booth (#759) during CTIA WIRLESS 2009. These instruments, which Anritsu has developed based on its active participation in 3GPP standardization and close work with major infrastructure, chipset, and terminal developers, are helping improve time to market and cost-of-manufacturing of LTE devices and systems.

At the forefront of Anritsu's family of LTE test solutions is the MD8430A Signalling Tester, the industry's first LTE base station simulator and a finalist in the CTIA Emerging Technology (E-Tech) Awards. The MD8430A is a multi-functional and cost-effective solution for manufacturers of LTE chipsets and mobile devices to evaluate their products. It is designed with 4 RF units that enable 2x2 MIMO system handover tests in a simulated network environment. End-to-end testing at downlink speeds up to 150 Mbps and uplink speeds up to 50 Mbps can be conducted by the MD8430A. Used in conjunction with Anritsu's Rapid Test Designer (RTD) or Protocol Test System (PTS), the MD8430A becomes a powerful solution for operator acceptance requirements, complete protocol stack verification and 3GPP TS36.523 conformance testing.

Anritsu has also developed LTE software and analysis tools that allow its MS269xA Signal Analyzer Series and MG3700A Vector Signal Generator to accurately measure LTE Uplink and Downlink signals. For the MS269xA, both the LTE Uplink and Downlink packages include analysis at the resource block level, and analysis resolution can be set to the physical channel, resource block, subcarrier, and symbol. EVM, a key figure of merit for LTE, is available at any resolution. Users can quickly test all varieties of unwanted emissions described in the LTE specification with the MS269xA. By pressing a single button, OBW, ALCR, and Out-of-Band Spurious Emissions measurements can be made. IQproducer, Anritsu's waveform generation software, has been enhanced to allow users to define test waveforms for the Uplink or Downlink. While standard test waveforms are not yet part of the specification, Anritsu's active roll in the standards groups has allowed it to develop IQproducer with a rich set of parameters and variations to create standard and unique waveforms for LTE signal analysis. When IQproducer is installed on the MS269xA and the MG3700A, the instruments can up convert and generate any waveform, including Uplink and Downlink data frames, and Uplink Random Access Preamble signals.

Anritsu is continuing to develop LTE test solutions as part of its support of the technology. As LTE begins its rollout later this year, Anritsu will provide the test tools necessary to ensure its performance and interoperability with existing mobile technologies.

Post a comment to this article