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StratEdge, a designer and producer of semiconductor packages for microwave, millimeter-wave and high speed digital devices, along with J microTechnology and Accel-RF, announced they will be hosting a seminar on monolithic microwave integrated circuit (MMIC) packaging, testing and reliability on June 14, 2006, at the Moscone Convention Center in San Francisco, CA, in conjunction with the MTT-S trade show.
The seminar will feature three experts in packaging and testing of high frequency devices. Jerry Carter, senior applications engineer for StratEdge, will discuss the latest package technologies and assembly techniques for microwave and millimeter-wave MMICs. Jerry Schappacher, an expert on probe technology, will discuss testing methods and probe stations for testing bare and packaged MMICs up through 65 GHz. Roland Shaw, president of Accel-RF, will discuss accelerated life-test/burn-in test systems for compound semiconductor devices, which are used in the implementation of broadband wireless infrastructures and networks.
"We are excited to be able to hold this seminar during MTT-S, which is one of the preeminent trade shows for microwave theory and techniques," said StratEdge president and CEO Tim Going. "We've had many questions about how to package and test MMICs. The seminar offers an opportunity for engineers to see the packages and test equipment and speak to the applications engineers to better understand how to maximize the characteristics of their own MMICs."
The seminar is by invitation only. For more details or if you wish to attend the seminar, contact Hannah Foster at (858) 569-5000 x130, or e-mail: email@example.com.
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