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Modelithics now offers its customers nonlinear X-parameter measurement and modeling services. This state-of-the-art technology is enabled through use of Agilent Technologies’ PNA-X Series Nonlinear Vector Network Analyzer (NVNA) and provides circuit board designers with mathematically correct extensions of S-parameters for large-signal conditions for devices such as amplifiers, mixers and RFIC/MMIC functional blocks. Additionally, this innovative technology characterizes the amplitudes and relative phase of harmonics, characterizes impedance mismatches, and can be applied to transistor modeling as an alternative to traditional compact equivalent modeling.
Modelithics President and CEO Larry Dunleavy had this to say: “I had the pleasure of visiting with Agilent’s research and development team in Belgium during their advancement of the Large-Signal Network Analyzer (LSNA), the predecessor to the current PNA-X NVNA platform. I applaud Agilent for reducing this powerful measurement and theoretical framework to a format that can be used by practicing engineers. We are very excited about working with Agilent Technologies in launching this new X-parameter measurement and modeling service. We are convinced that X-parameters are a very important nonlinear tool set for any modeling team.”
Gregg Peters, Vice President and General Manager of Agilent's Component Test Division, commented that, “We are looking forward to working with Modelithics as they support our mutual customers with the type of nonlinear behavioral models that will help them better understand the value of X-parameters and Agilent’s NVNA technology.”
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