Items Tagged with 'low-frequency'

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Keysight integrates low-frequency noise measurements in wafer level solution platform

Keysight Technologies Inc. announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight’s WaferPro Express software—a platform that performs automated wafer-level measurements of semiconductor devices.


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Keysight’s low-frequency noise measurement system adopted by China CEPREI Lab

Keysight Technologies, Inc. announced that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer(A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.


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Keysight selects Fraunhofer EMFT as its first low-frequency noise reference center

Keysight Technologies Inc. announced that Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT (Fraunhofer EMFT) is the first low-frequency noise measurements reference center able to demonstrate the Keysight EEsof EDAs E4727A Advanced Low-Frequency Noise Analyzer in Europe, the Middle East, Africa and India (EMEAI).


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