Items Tagged with 'agilent'


Visit Agilent at IEEE MTT-S International Microwave Symposium 2014

Focus on the latest developments in microwave technology at the IEEE MTT-S International Microwave Symposium 2014 in Tampa, Florida, June 1-6. Join the world's largest gathering of RF/uW professionals in workshops, short courses, paper presentations, and panel sessions. Stop by Booth 1133 to discover the difference Agilent solutions can make in helping you achieve breakthrough results.

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Agilent Technologies' automatic fixture removal option enables industry's fastest, easiest non-coaxial device measurement

Agilent Technologies Inc. announced the availability of a powerful new automatic fixture removal (AFR) option for its PNA Series network analyzers. Previously available only in Agilent’s Physical Layer Test System (PLTS) software, the error-correction technique is the industry's fastest, easiest way to accurately measure non-coaxial devices, saving engineers time and money.

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Agilent Technologies introduces impedance analyzers with flexible frequency options

Test & Measurement

Agilent Technologies Inc. introduced the Agilent  E4990A and  E4991B impedance analyzers, specifically designed for R&D, quality assurance and inspection engineers characterizing and evaluating passive electronic components, semiconductor devices and materials. The analyzers provide unparalleled accuracy and the best performance in the industry with flexible frequency options, all at an affordable price.

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