White Papers

Behavioral Modelling Challenges for RF System Simulation

Designing RF systems to operate with wideband modulated signals, like 5G and RADAR, or with a large number of circuits, like active antennas, is challenging. AMCAD Engineering introduces new behavioral models for power amplifiers that include low and high-frequency memory effects allowing robust and accurate DPD algorithm evaluation and validation.

Wolfspeed Large-Signal Models: Accurately Validating RF Designs

This article will provide a top-level view of Wolfspeed's large-signal models for GaN power transistors and their application in an RF design. The article will include an overview of Wolfspeed's GaN on SiC devices, the associated large-signal models, and their advantages versus real-world devices during the development process. The piece will continue with an overview of a typical design procedure and a case study, then conclude with a discussion of the resources available to designers and how to get started.

Ensuring Performance of Connected Home Electronics Products

Your challenge: Testing coexistence and user experience to ensure high quality of service in real-world use, and ensuring security and product compliance for risk free market introduction. Rohde & Schwarz is a one-stop shop catering to all wireless RF coexistence test and measurement requirements.

Analog Devices Advances RF/mW in The Space Industry

On Saturday, May 30th, people across the world watched in awe as SpaceX launched a rocket, designed independently of any government, putting two astronauts into orbit on their way to the International Space Station — the first time in history for any commercial company. Ten years ago, this would have been an unthinkable endeavor for any commercial or private organization.

Time Domain Analysis with a VNA

A Vector Network Analyzer (VNA) natively measures complex S-parameters of a device under test (DUT) in the frequency domain mode by sweeping across various frequency points. While there is an exhaustive list of measurements that can be accomplished in the standard frequency domain mode – using the advanced inverse Chirp z-transformation, the measurements can also be simultaneously analyzed in the time domain mode. This gives the added advantage where the two fundamental modes of analysis can be performed by one single instrument.

A New Generation of 5G Filter Technology

5G implementation is accelerating and the promise of higher data rates means more challenges. Demand for more bandwidth increases the probability of interference in mobile devices, driving the need for advanced filtering. Qorvo's BAW filters have evolved to address higher frequencies in shrinking RFFE real estate, while maintaining RF output power.

5G Evolution – on the Path to 6G

5G is now - what´s next? 5G deployments have only recently started, and releases beyond R15 will continue to tap into the tremendous potential of 5G. However, as a new generation of cellular technology typically appears every 8-10 years, 6G can be expected around 2030. Download this white paper to explore the evolution from 5G to 6G from a service, air interface and network perspective.

Improving T/R Module Test Accuracy and Throughput

This white paper provides an overview of the basic building blocks of a phased array system and discusses how the nature of their design leads to a challenging test environment. Real measurement configuration examples are shown to highlight the flexibility required for T/R module testing.

Time Domain Analysis with Copper Mountain Technoloiges Vector Network Analyzers (VNA)

In many applications it is necessary to make multiport measurements. The RNVNA links up to 16 1-Port analyzers together into a multiport network analysis system. Each of the 16 analyzers will make individual vector reflection measurements and scalar transmission measurements from port to port. In other words, S11, S22, S33 and so on will be complex measurements and S21, S31, S41 and so on will be scalar only measurements.

Jitter Analysis with the R&S®RTO Digital Oscilloscope

This application note introduces the Jitter analysis capabilities of the R&S® RTO Digital Oscilloscope and the Jitter option R&S®RTO-K12 for digital signals. It provides background information on jitter sources and standard jitter measurement tools. Furthermore it demonstrates Period jitter, Cycle jitter and Time Interval Error jitter measurements based on an application example. The benefits of different representations of the measurement results with histogram, track and spectrum display are discussed.
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