The 107th ARFTG Microwave Measurement Conference is co-located with IMS2026. The theme for this conference is Measuring the Future: High-Frequency Metrology for Intelligent, Connected, and Quantum Worlds

The most important part of the ARFTG experience is the opportunity to interact with colleagues, experts and vendors of the RF and microwave test and measurement community.

ARFTG-107 Conference focus topics: 

• High-frequency metrology and traceability of electrical quantities
• Calibration and measurement techniques for future communication systems and sensing applications
• New measurement instrumentation
• Cryogenic measurements for quantum and radio astronomy applications
• Microwave measurement techniques applied to AI technologies
• Non-linear measurements
• Metrology for EO/OE interfaces and photonic integrated circuits

Topics always of interest including:

• On-wafer calibration and measurements
• Large signal measurements incl. linearization of devices, circuits, and systems
• Characterization of material properties
• RF/digital mixed-signal measurement and calibration
• Millimeter-wave antennas, OTA testing, and RIS testing
• Other recent developments in metrology incl. measurement uncertainty