C.Y. Su, S.J. Chang, L.P. Chen, Y.P. Ho, G.W. Huang, D.C. Lin, B.M. Tseng, H.Y. Lee, J.F. Kuan, Y.M. Deng, K.A. Wen, C.Y. Chang

Articles by C.Y. Su, S.J. Chang, L.P. Chen, Y.P. Ho, G.W. Huang, D.C. Lin, B.M. Tseng, H.Y. Lee, J.F. Kuan, Y.M. Deng, K.A. Wen, C.Y. Chang

An Automatic Macro Program for Radio Frequency MOSFET Characteristics Analysis

Introduction to an automatic macro program used for the analysis of radio frequency MOSFETs

October 1, 2001

C.Y. Su, S.J. Chang, L.P. Chen, Y.P. Ho, G.W. Huang, D.C. Lin, B.M. Tseng, H.Y. Lee, J.F. Kuan, Y.M. Deng, K.A. Wen, C.Y. Chang

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Technical Feature An Automatic Macro Program for Radio Frequency MOSFET Characteristics Analysis The parameter extraction language (PEL) in Agilent IC-CAP software is used to develop an automatic macro program for the analysis of the characteristics of RF MOSFETs. By using this powerful macro program, the time spent on the...