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The 804/1 is an 8 GHz, full-size analyzer providing lab grade performance in a 19-inch chassis, including both 2-port configuration and direct receiver access. All devices are ATE compatible, rack mountable, and easy to program and share between multiple users.
CMT VNAs are USB-based and do not have built-in computers. There are benefits to having the VNA measurement module separate from the processing module. The USB VNAs must run with an external PC and the VNA to work. You can consider the VNA software as the driver for VNAs.
This paper outlines proper setup and measurement procedure for performing dual band measurements with a CMT 4-port Cobalt VNA. This example setup uses two ports for measurements in a low frequency band, while the other two ports are used for measurements in a separate, higher frequency band.
Third order intercept (IP3) is a hypothetical point at which the fundamental signal power and the third order signal power is the same. In practice, we can never reach this point as the amplifier saturates even before this condition occurs. However, IP3 plays an important role in characterizing the device.
Automatic Fixture Removal is a simple, accurate way to de-embed measurement fixtures. These are typically used when measuring SMD type components to provide an interface from the VNA test port cables to the DUT. The main challenge when characterizing such components is to completely isolate DUT characteristics from the fixture.
A Vector Network Analyzer (VNA) natively measures complex S-parameters of a device under test (DUT) in the frequency domain mode by sweeping across various frequency points. While there is an exhaustive list of measurements that can be accomplished in the standard frequency domain mode – using the advanced inverse Chirp z-transformation, the measurements can also be simultaneously analyzed in the time domain mode. This gives the added advantage where the two fundamental modes of analysis can be performed by one single instrument.
With the rapid growth of wireless communication and sensing, there has been increased development of technologies at ever higher frequencies or smaller wavelengths. For example, high bandwidth communication addressed in the 5th Generation (5G) cellular network standards has motivated the opening of spectrum within the K and Ka bands (18-40 GHz). Whether repurposing existing lower frequency materials or developing new higher-frequency optimized materials, component developers need accurate material properties to use in their component designs.
Automatic Fixture Removal (AFR) is a simple and an accurate way to de-embed a measurement fixture. These fixtures are typically used when measuring Surface Mount Device (SMD) type components to provide an interface from the Vector Network Analyzer (VNA) test port cables to the Device Under Test (DUT). The main challenge when characterizing such components is to completely isolate the actual DUT characteristics from the fixture; which becomes even more challenging at higher frequencies.
