Test & Measurement Channel - Leading Manufacturer News, Articles & Content

Agilent Software Automates STMicroelectronics' Device Modeling On-Wafer Measurements

Agilent Technologies Inc. announced that its IC-CAP Wafer Professional (WaferPro) software has been successfully deployed at STMicroelectronics . WaferPro adds new capabilities to Agilent’s Integrated Circuit and Analysis Program (IC-CAP) software platform to enable efficient, automated on-wafer measurements for device modeling applications. STMicroelectronics uses IC-CAP as a device modeling...
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Accelerate your LTE Signal Burst Power Measurements

This application note explains how to generate LTE-TDD and LTE-FDD signals using Agilent N7624B/N7625B Signal Studio software along with Agilent ESG Vector Signal Generator. A step-by-step guide demonstrates time-gated/average burst signal measurement as well as CCDF measurement for LTE-TDD and LTE-FDD signals using the Agilent P-Series power meter and sensor.
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Agilent Updates IO Libraries Suite with PXI Support for Modular Instruments

Agilent Technologies Inc. announced the release of its IO Libraries Suite 16.0 software. The new release connects to more types of instruments and features discover-and-connect capabilities for PXI chassis and instruments using Agilent Connection Expert (ACE). For higher speed instruments, IO Libraries Suite 16.0 now supports HiSLIP (High-Speed LAN...
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