Test & Measurement Channel - Leading Manufacturer News, Articles & Content

Royally Honored Prof. J. David Rhodes to Speak at IMS 2011

Professor J. David Rhodes, CBS, FRS, FR Engineering Emeritus Professor at the University of Leeds, will be the plenary session speaker on Monday, June 6 at the IEEE MTT-S 2011 International Microwave Symposium (IMS). Since founding Filtronic more than 30 years ago, Rhodes has received the OBE (the Officer...
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IMS MicroApps Nonlinear Characterization Expert Forum

Announcing the IEEE MTT-S IMS 2011 MicroApps
Nonlinear Characterization Expert Panel & Webcast

This FREE 90 minute forum examines the latest trends in nonlinear device characterization including new measurement equipment and device representation in EDA tools. An open panel session will follow the presentations with questions from the live and online audience.

Baltimore, MD and MWJournal.com
Live: June 8, 12:00 to 1:30 pm

Details and registration

Sponsored by Agilent, Anritsu, R&S and Tektronix


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Anritsu Introduced Value-based Spectrum Master

Anritsu Co. (CTIA Booth #2234) introduced the MS2711E Spectrum Master, a handheld spectrum analyzer designed for technicians, installers, field RF engineers, and contractors responsible for monitoring the growing number of interfering signals, as well as assessing signal quality on a wide range of increasingly complex signals. Easy to use,...
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