Software & CAD

Rohde & Schwarz Displays System for Generation and Analysis

Rohde & Schwarz demonstrated a complete system for generating and analyzing user-defined and standard independent Orthogonal Frequency Division Multiplex (OFDM) signals at its booth (2407) at the International Microwave Symposium. The system consists of R&S signal generators and a signal analyzer using OFDM specific measurement software and covers microwave...
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CST Introduces Scheme for Access to Simulation Acceleration Options

Computer Simulation Technology (CST) announced new flexibility for customers interested in simulation acceleration. Design engineers and researchers working in all areas of microwave and RF device R&D are constantly striving to shorten simulation times and therefore development cycles. To meet these demands, CST is researching new technologies to improve...
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Awr

EM Analysis within the Design Flow

Prior to the circuit design and especially in larger designs, EM tools are used to create “library” parts such as inductors, transitions and antennas. While these parts are fairly self-contained, they must ultimately be integrated into the overall design where at the very least they must be connected to the rest of the circuit or in a more complex case be coupled to it. During both early and later stages of design, designers will switch from circuit-based models to EM analysis of critical interconnects to better understand couplings and achieve greater accuracy.
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R&s

Rohde & Schwarz Develops a New Technique for Group Delay Measurements without LO Access

This paper describes a technique developed by Rohde & Schwarz for the network analyzers of the R&S®ZVA family: It allows high-precision group delay measurements of converters and mixers even without access to the local oscillator or the reference signal. This technique uses a two-tone signal to stimulate the mixer or converter. The phase difference between these two carriers is measured at the input and the output of the DUT (device under test) to calculate the group delay from the phase shift caused by the DUT.
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