Analog Devices, Inc. introduced new highly integrated RF ICs that greatly simplify the design and reduce the development cost of multi-band base stations and point-to-point (PtP) radios. These new devices include the ADRF6720 I/Q modulator, ADRF6820 I/Q demodulator and ADRF6612 dual-mixer. The highly integrated devices enable the design of base station and high-performance radios requiring multi-band support, high dynamic range and wide channel bandwidths. These products are ideal for designs for 3G/4G communication, microwave PtP radios, military/aerospace and instrumentation applications. ADI’s new RF ICs offer the same performance as radio designs based on a combination of discrete solutions, yet in a significantly smaller form factor. The new devices feature an embedded low phase noise synthesizer, RF switch and balun, digital step attenuator (DSA) and programmable linearity optimization.
Texas Instruments announced the addition of the RF Software Development Kit (RFSDK) to its Base Station SoftwarePac, enabling small cell developers to configure the baseband-to-radio communication and achieve first call or system verification in just one day compared to the weeks or months it took previously. With the new RFSDK, TI's KeyStone™- based TCI6630K2L small cell System-on-Chip (SoC) and TCI6631K2L backhaul SoC can now seamlessly implement digital radio functions like digital pre-distortion (DPD) and crest factor reduction (CFR), and use a JESD204B interface to communicate with TI's analog front end transceiver, the AFE7500, to maximize performance and system power efficiency. 
Horizon House has announced plans to launch the inaugural Electronic Design Innovation Conference (EDI CON 2013) in Beijing, China in March 2013 that will focus on design concepts and techniques of RF, microwave and high-speed digital components and systems in China
AR RF/Microwave Instrumentation has developed a product which uses a patented test process that adds additional test frequencies, or tones, for each test period, or dwell time. Rather than testing one tone per dwell period, we add additional tones to effectively increase the test efficiency by a factor approximately equal to the number of tones used.