This eBook covers some of the new advancements in VNA technology that are enabling new applications to use VNAs for characterization. The first article looks at a modular VNA architecture that presents a new alternative for S-parameter measurements by eliminating long cable runs and simplifying the test setup. The next article examines some popular choices for de-embedding techniques and experimentally looks at performance in some WR5 fixtures from 140 to 220 GHz. The third article reviews the importance of accurate dielectric constant measurement on laminate PCB materials for mmWave applications, most of which are done with a VNA. Increasingly, broadband mmWave VNA measurements are needed at higher frequencies, creating measurement challenges so the last article covers an integrated 70 kHz to 220 GHz VNA with a single connection to the DUT. Learn about all of these topics in this eBook.
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