Copper Mountain Technologies (CMT) and Compass Technology Group (CTG) are pleased to announce their new Epsilometer solution for measuring the dielectric properties of materials. This solution measures dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 mm to 3 mm thick.

Dr. John Schultz of CTG commented, “Unlike previous dielectric analysis technologies, this new method uses computational electromagnetic modeling to invert the dielectric permittivity and loss. This represents a significant advance over conventional methods, which use analytical approximations and are limited to frequencies below 1 GHz.”

With the launch of Epsilometer CMT delivers another solution that combines its metrology-grade portable network analyzers with subject matter expertise to solve important industry problems. CMT CEO Irena Goloschokin stated, “Accurate determination of dielectric properties of radomes, packaging and microwave substrates is important for design of functioning wireless devices for the IoT and emerging 5G applications.”