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Integrated Device Technology (IDT)has expanded its RF portfolio with two new Glitch-Free™ digital step attenuators (DSA) and the first product in a new family of voltage variable attenuators (VVA). Designed in RF silicon, these attenuators achieve wide bandwidth, low insertion loss, high linearity, pinpoint attenuation accuracy and a wide temperature range from -40° to 105°C. The products meet the stringent demands of wireless infrastructure, point-to-point microwave links, satellite communications and general-purpose communication applications.

The DSAs feature IDT’s industry first Glitch-Free technology, reducing attenuation switching overshoot during the most significant bit transitions by up to 95 percent. This feature simplifies the control software, improves reliability, prevents damage to downstream components such as power amplifiers, and limits over-ranging of data converter inputs. Covering 1 MHz to 4 GHz, the F1912 DSA is a 6-bit device with 0.5 dB step size and 31.5 dB attenuation range. Attenuation step error is 0.1 dB, with 1.4 dB insertion loss at 2 GHz. The F1956 is a 7-bit device that also covers 1 MHz to 4 GHz, with 0.25 dB step size and 31.75 dB attenuation range. Attenuation step error is 0.1 dB with 1.3 dB insertion loss at 2 GHz. The input IP3 of both DSAs is 64 dBm. The F1912 has a 0.1 dB compression point of 31 dBm, 34.5 dBm for the F1956.

The F2250 VVA covers 50 MHz to 6 GHz and has a highly linear (in dB) analog attenuation range of 33.6 dB. Insertion loss is 1.4 dB at 2 GHz, input IP3 measures 65 dBm and the 1 dB compression point is 34.4 dBm. The design includes a “Vmode” feature that allows either positive or negative attenuation control.

Pin compatible with competitor products, IDT’s new attenuators are assembled in TQFN packages: 3×3 mm for the F2250, 4×4 mm for the F1912 and 5×5 mm for the F1956.

Integrated Device Technology Inc.
San Jose, Calif.