Global connectivity supplier HUBER+SUHNER unveils its new high speed digital testing solutions at DesignCon 2015. The company has chosen the Santa Clara event for the global launch of its MPX50 precision multicoax connector solution which combines the highest density, lowest loss and highest performance characteristics for cutting edge data rate testing in one testing solution.
Also on show for the first time at the company’s DesignCon booth #949 will be the SUCOFLEX 229 loss revolution for dynamic applications and the HUBER+SUHNER high signal fidelity testing solution, Minibend L/MMPX.
The products are part of HUBER+SUHNER’s broad portfolio of high end RF test components and assemblies, developed and optimized for high speed digital testing at rates up to 50 GHz/ 50 Gbps.
The MPX50 50 Gbps/50GHz multicoax solution is based on a triplex approach that includes the company’s MXP PCB connector with maximum density and highest performance, the MULTIFLEX 53-02 breakout assembly and the SUCOFLEX 100 cable assembly, designed to connect measurement equipment with lowest loss.
Stéphanie Jarno, HUBER+SUHNER’s market manager onstrumentation, North America said, “In a world where performance, speed and density matter, innovative high speed digital testing solutions are key. We are excited to be able to show the semiconductor industry our new developments – they come at a time when enterprises are looking to save time and money on their testing requirements and our solutions are designed to deliver these objectives.”
The MXP50 allows testing up to the highest level – the broadband characteristics of the entire MXP series and the true coaxial-to-PCB transition of up to 50 Gbps/50 GHz allows the design of evaluation boards and test set-ups for the latest generation of semiconductor standards.
The dense interface pitch of the PCB connectors mean that they take up less space on the boards. This is particularly important in high speed testing where costly high performance board material is essential for good signal integrity at high data rates. In addition the compact design of the PCB connector allows it to be positioned directly next to the DUT/chip helping to keep transmission lines on the chip short and losses low. The highly reliable push-on mating with its slide-on interface design means that assemblies can be replugged quickly and easily while still guaranteeing reliable stable electrical values after numerous mating cycles. The highly flexible MULTIFLEX cable in combination with a detailed numbering and coding system ensures easy channel handling without degradation of signal integrity.
DesignCon 2015 visitors can discover more about the HUBER+SUHNER range of high speed digital testing solutions at the company’s Booth No. 949 in Santa Clara from January 27-30.