Metrology for High Speed Circuits and Systems
Welcome to the 81st Automatic RF Techniques Group (ARFTG) Microwave Measurement Conference being held at the Grand Hyatt Seattle on Friday, June 7, 2013.
The Friday schedule includes four sessions with 15 oral presentations and an interactive forum with 25 posters. Fueled by breakfast, lunch and coffee breaks, exhibitors with table-top displays interact in ways impossible to find in larger halls.
The contributed conference papers range from practical methods and techniques to cutting edge research on measurement technology and over such topics as nonlinear measurement systems, calibration issues, on-wafer measurement, uncertainty, broadband and millimeter-wave, and other areas of RF and microwave measurement.
Your ARFTG conference registration also includes access to joint IMS/ARFTG measurement sessions on Thursday, the Nonlinear Vector Network Analyzer (NVNA)Users’ forum Thursday night, and a one year membership in ARFTG.
Thursday’s joint sessions are “Measurements Supporting Active Device Modeling” and “Innovative Measurements Across the Spectrum (RF to THz).” The NVNA Users’ forum is an informal discussion group devoted to sharing information and issues related to instrumentation utilized in vector large-signal analysis of microwave circuits and systems that contain nonlinear elements. This event is open to all ARFTG, IMS and RFIC attendees.
Consider also registering for one of the ARFTG sponsored workshops: “The Importance of Low-Frequency Measurements on High-Frequency Characterization” and “High Speed Signal Integrity.” These all-day workshops are scheduled for the Monday of Microwave Week and provide focused analyses of these interesting topics.
No better opportunity is available to interact with vendors, experts and colleagues in the RF and microwave test and measurement community. Ask questions, propose collaboration or simply learn vicariously from their hard-won experience. ARFTG’s two annual conferences are well known for this unique opportunity and welcoming environment. Starting with breakfast and continuing through the exhibition, interactive forum and luncheon, there will be ample opportunity for discussion with others facing similar challenges. Attendees find that these interactions are often the best source of ideas and information for their current projects.
Full details of the technical program and conference are available at www.arftg.org. ARFTG Conference registration is available through the IMS website at www.ims2013.org.
81st ARFTG Highlights
Monday
ARFTG Sponsored Workshops (not included in ARFTG registration)
WMC - The Importance of Low-Frequency Measurements on High-Frequency Characterization
WME - High Speed Signal Integrity
Thursday
ARFTG/IMS Joint Technical Sessions
TH2D - Measurements Supporting Active Device Modeling
TH3D - Innovative Measurements Across the Spectrum (RF to THz)
Nonlinear Vector Network Analyzer Users’ Group
Friday
Four Oral Presentation Sessions and Interactive Forum
Intimate Vendor Exhibit
Breakfast, Lunch and Coffee Breaks (AM and PM)
USB Conference Digest (includes all technical sessions)
ARFTG membership included in conference registration
For more information, visit www.arftg.org