The UT3 Platform is COMPRION’s conformance platform for testing according to the requirements of GCF/PTCRB (listed as test platform TP 118) and the NFC Forum. As a test system supporting all the contact-based and contactless smart card interfaces - be it ISO/IEC 7816, SWP/HCI, IC- USB or NFC - the UT³ Platform is the right solution for testing mobile phones, contactless terminals, chipsets, NFC chips, NFC devices, M2M modules or laptops.
The platform offers both analogue and digital simulation of all interfaces. An integrated oscilloscope ensures that the analogue signal behavior is not influenced by additional parasitic effects caused by the connection of external measurement equipment. Another benefit of the UT3 Platform lies in the ability to test contact-based and NFC protocols synchronously. Thus, the UT3 Platform provides the entire picture of data exchanged between the UICC, the CLF and the contactless device.
Like all COMPRION tools, UT3 Platform stands for convenience and easy handling by the test operator. The UT3 Platform has a very high automation level, reducing the operator’s work to a minimum level. An integrated Test Plan Manager guides the test operator through the definition of the respective device under test (DUT) and uses the specified DUT features to guarantee a complete arrangement of all mandatory test cases in one test plan. Advanced administration of test execution logs and test reports enables customised result statistics and reporting on the test case and test plan level.
Andreas Bertling, Product Manager at COMPRION, said, “One advantage of the new system is that - as with all COMPRION tools - we offer a one-stop solution with perfect matching hardware and software coming from one source. We are also proud that all the different technologies can be tested with a single box, making the handling of testing very convenient for the customer and securing their investment well into the future.”
In time for the Mobile World Congress, COMPRION is pleased to premiere the first ever PTCRB validated SWP/HCI tests, which will be shown on the new conformance platform UT