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Items Tagged with 'testing'

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GradConn launches low cost test probe cable assemblies

GradConn
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GradConn has launched a new range of low cost co-axial test probe cable assemblies for the inspection of high frequency circuits.


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NEC solutions complete interoperability testing at Small Cell LTE Plugfest 2

NEC Corporation
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NEC Corporation successfully completed interoperability testing of its multi-vendor SON and Small Cell Femto Solution at the Small Cell LTE Plugfest 2.


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Anite launches multi-purpose LTE wireless core networking tool

Anite
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Anite has launched Triton, an LTE wireless core network testing tool that enables mobile operators and network equipment manufacturers to address growing Quality of Experience testing requirements.


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TMD Technologies exhibiting at IEEE EMC 2014 in Raleigh, NC

TMD Technologies
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 TMD has recently launched a range of ultra-high power pulsed TWT amplifiers, optimized for use in high intensity radiated fields (HIRF) EMC testing. Using these instrumentation amplifiers, EMC test laboratories have generated 14,000 V/m, easily complying with the latest, most demanding RTCA/DO-160 test requirements.  


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SGS selects Anite’s Propsim channel emulators for Taiwan test lab

Anite
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SGS has selected Anite’s Propsim channel emulators for its new anechoic MIMO Over-The-Air test laboratory in Taiwan.


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Agilent introduces family of basic AC power sources for reliable testing

Agilent Technologies
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Agilent Technologies Inc. introduced a family of basic AC power sources that deliver stable, reliable power for testing electronic devices during design and manufacturing. The new Agilent AC6800 Series includes four models from 500 to 4000 VA output power, all with the quality and capability required for basic testing. 


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Anritsu's family of RF VNAs for variety of passive device testing environments

Anritsu Company
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Anritsu Co. addresses the market need for value and performance when testing RF passive devices with the introduction of the ShockLine™ MS46522A 2-port RF VNA family with frequency coverage from 50 kHz to 8.5 GHz. The ShockLine MS46522A VNA is designed for testing passive devices such as cables, connectors, filters, and antennas in a wide variety of engineering, manufacturing and education applications.


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Anite is first to offer 4x4 MIMO device testing capability

Anite
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Anite, a global leader in wireless equipment testing technology, announced that it is first to offer chipset and device manufacturers the ability to verify their 4x4 Downlink (DL) MIMO designs and products, accelerating the development of LTE and LTE-Advanced devices. The milestone was achieved in close collaboration with a leading device manufacturer using Anite’s Development Toolset - an easy to use solution for early stage testing.. 


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Agilent announces NFC Forum approval for analog test system

Agilent Technologies Inc., Santa Clara, CA
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Agilent Technologies Inc. announced the successful validation of its T3111S NFC Test System for NFC Forum Analog testing.


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Anite and Intel to develop ‘virtualised’ testing environments for 4G and 5G

Anite and Intel
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Anite has announced its participation in a project initiated by Intel to develop ‘virtualised’ testing environments in order to accelerate 4G and 5G technology development and testing.


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