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AWR’s new application note titled, "Multisim/Ultiboard for Low-Frequency Simulation and Layout" details how to complement Microwave Office® circuit design software with NI’s Multisim circuit simulation software and Ultiboard printed circuit board (PCB) layout software for a comprehensive design flow.
The Raytheon Co.-led Cobra Judy Replacement (CJR) program surpassed expectations during its first tests against a live rocket launch on March 19. From approximately 100 miles off the Florida coast, the powerful X- and S-Band radars integrated onboard the USNS Howard O. Lorenzen (T-AGM 25) successfully acquired and tracked both stages of an Atlas V rocket launched from Cape Canaveral and collected all associated data.
Tektronix Inc. announced the industry’s first demonstration of a M-PHY test solution for silicon-proven HS-Gear3 IP, a key part of the MIPI Alliance M-PHY physical layer specification for mobile devices. The Tektronix test solution allows designers to quickly and efficiently characterize designs and verify performance.
Cree Inc. and Eta Devices Inc. will demonstrate the world’s most efficient reported power amplifier for mobile base stations at the 2013 Mobile World Congress, February 24-28 in Barcelona, Spain.
Vishay Precision Group Inc. unveiled a new demonstration video that shows the actual process by which the company's Vishay Foil Resistors (VFR) brand is able to ship samples of Bulk Metal® Foil precision resistors within any resistance value within a 0.01% tolerance within one to five days.
Sumitomo Electric Device Innovations USA Inc. (SEDU) will be showing its full line of GaN HEMTs at this year’s MTT-S IMS 2012 Show in Montreal.
Anritsu Co. announces it will demonstrate the world’s only broadband Vector Network Analyzer (VNA) system that can conduct single sweeps from 70 kHz to 140 GHz in its booth (#807) at the International Microwave Symposium (IMS), to be held June 19-21, in Montreal. The on-wafer device characterization is one in a series of demonstrations to be conducted in Anritsu’s booth that will highlight test solutions for high-frequency designs, including E-band applications and high-speed signal integrity measurements.
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