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White Papers

Improving Measurement Accuracy for High Frequency RF Connectors

Improving the accuracy of your microwave test and measurement equipment becomes increasingly important when high frequency devices are used in the transmission paths of radio, cellular, satellite and digital communications. This discussion helps to solve problems with measurement errors during and after calibration of your microwave test instrument.

New Low-Profile Hermetic LTCC Mixer Series Raises the Bar for Reliability, Performance, and Price

A new family of ultra-reliable mixers, developed by Mini-Circuits, combines low-temperature cofired ceramic (LTCC) circuitry and specially selected semiconductor dice in a hermetically sealed case at 1/10th the price of comparable products on the market. Fully automated, tightly-controlled, and highly repeatable processes ensure excellent performance at temperatures up to 125 degrees C.

How to measure 5-nanosecond rise/fall time in pulsed power amplifiers

Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with Agilent Technologies 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.

Wireless Transmitter IQ Balance and Sideband Suppression

This application note presented by Richardson RFPD discusses the major causes of nonideal sideband suppression and discusses design considerations for component selection and PCB design/layout.

Multi-tone Testing Can Save Both Time and Money

AR RF/Microwave Instrumentation has developed a product which uses a patented test process that adds additional test frequencies, or tones, for each test period, or dwell time.

Minimizing PIM Generation From RF Cables and Connectors

Understanding mechanical tolerances, coaxial design details and connector materials used in cable assemblies helps produce communications equipment with the lowest levels of passive intermodulation (PIM).

Creating a Solution for Testing Frequency-Hopping Spread Spectrum Devices

Wide bandwidth, high resolution AWGs
Measurement needs have driven the development of high-bandwidth AWGs, but they lacked accuracy and high resolution. Until now, AWG technology forced serious trade-offs between either high resolution or wide bandwidth. With the new Agilent M8190A 12 GSa/s arbitrary waveform generator, you will get both in one instrument!

Solutions for LTE-Advanced Physical Layer Design and Test

LTE-Advanced (LTE-A) is an emerging mobile communications standard that boasts a number of significant benefits, including the ability to take advantage of advanced topology networks and achieve target peak data rates of 1 Gbps in the downlink and 500 Mbps in the uplink. This white paper covers using signal generation and analysis to overcome challenges associated with carrier aggregation.

Electronically Scanned Arrays for Fast Testing of Large Antennas

This paper discuss the adaptation of the fast multi-probe technology to an existing classical planar near field facility through the manufacturing, installation and test of a partial demonstrator in Thales Alenia in Toulouse.

Leveraging OFDMA Technology for HLS Applications

In this paper we take a closer look at various OFDMA based Broadband Wireless Access (BWA) for Homeland Security (HLS) applications and their implementation. Our primary focus is to understand the capabilities required from these applications and to show how flexibility and controllability of system components can help address these requirements.


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