Articles Tagged with ''test''

ME7873L RF/RRM Conformance Test System

ME7873L_FrontAnritsu Co. announces that its ME7873L RF/RRM Conformance Test System has achieved the world’s first test platform approval criteria (TPAC) for LTE-advanced carrier aggregation (CA). This industry-leading achievement in the Global Certification Forum (GCF) enables wireless device manufacturers to implement certification of devices employing this new technology. 


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AMETEK acquires VTI Instruments

AMETEK Inc. has acquired VTI Instruments, a leading manufacturer of high-precision test and measurement instrumentation, for $74 million.  VTI, acquired from an investor group led by Merit Capital Partners and Alerion Capital Group, has annual sales of approximately $38 million. 


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UBM Tech's DesignCon 2014 post conference report

UBM Tech, the daily source of essential business and technical information for decision makers in the electronics industry, held its annual DesignCon conference and expo last week in Santa Clara, CA.  Met with enthusiastic industry reception, DesignCon 2014 was attended by more than 5,000 members of the chip, package, board and systems design communities.


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Aeroflex introduces one-box LTE-A base station tester

Aeroflex Ltd., a wholly owned subsidiary of Aeroflex Holding Corp., has launched an extended version of its TM500 industry-standard base station tester capable of emulating several thousand LTE user equipments (UE), fading channel models, and LTE-A carrier aggregation functionality in a one-box benchtop unit. The TM500 Test Mobile delivers more leading edge LTE-A development capability with a higher UE density than any other solution on the market.


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Agilent announces ENA Series network analyzer that reduces cost, optimizes test of RF components

Agilent Technologies Inc. announced theE5063A ENA Series network analyzer, a low-cost ENA solution for manufacturing test. The instrument offers optimized performance and functionality for testing simple RF passive components, such as handset/BTS antennas, RF cables and filters. It can also be used in R&D for evaluation of RF passive devices and dielectric materials.


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