Articles Tagged with ''x-series''

Keysight’s new user experience builds on tradition of unsurpassed quality, craftsmanship

Keysight Technologies, Inc. announced the new design of Keysight products built on a platform of exceptional user experience, with advances in multi-touch user interface and an environmentally responsible build and re-use model. The contemporary, new look complements the company’s uncompromised history of quality and craftsmanship.


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Agilent's newest X-Series measurement application supports LTE-A RF conformance testing to 3GPP Release 11

Agilent Technologies Inc. extended its leadership in LTE-Advanced measurement with its latest X-Series measurement application release. The software provides the most comprehensive RF conformance testing of LTE-Advanced FDD and TDD transmitters and components to the 3GPP Release 11 specification. It is available for both benchtop and modular products.


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Agilent introduces wireless communications test set with integrated multiport adapter

Agilent Technologies Inc. introduced its new E6607C EXT wireless communications test set, featuring an integrated multiport adapter for cost-effective, high-volume wireless device manufacturing test. Optimized for testing multiple devices simultaneously, the EXT-C with integrated multiport adapter enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1.3x the price.


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Agilent introduces industry's lowest-priced USB 2.0 signal-quality test option

Agilent Technologies Inc. introduced the industry’s lowest-priced USB 2.0 signal-quality test option. This option for the InfiniiVision 4000 X-Series oscilloscopes supports low-speed, full-speed and hi-speed USB applications. The USB interface is used extensively for computer applications and for a broad range of embedded connectivity applications.


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